WITec and Zeiss expand choices for researchers

By staff reporter

- Last updated on GMT

WITec’s RISE Microscopy with ZEISS Sigma 300 SEM
WITec’s RISE Microscopy with ZEISS Sigma 300 SEM
WITec’s system for correlative Raman-SEM imaging has been made available with the Zeiss Sigma 300, a field emission scanning electron microscope (FE-SEM).

The jointly-developed system provides an integrated instrument available as an OEM product through Zeiss that features a standard, unmodified vacuum chamber and SEM column along with a complete confocal Raman microscope and spectrometer.

The firm’s said it can benefit researchers in nanotechnology, life sciences, pharmaceutics, materials research and other applications.

WITec’s Raman Imaging and Scanning Electron (RISE) microscopy system helps researchers survey their sample and locate areas of interest.

Switching between measurement modes is done through the software which also helps the transformation of Raman spectroscopic data into an image which can be overlaid onto the SEM image to produce a RISE image.

Dr Olaf Hollricher, co-founder and director of R&D at WITec, said: “Our Raman technology can visualize the distribution of chemical species within a sample, and do it quickly. Combine that with the structural resolution of SEM and you get a properly comprehensive understanding of a sample.”

The configuration allows the Raman microscope to be attached through a standard port of the SEM.

FE-SEMs enable structural characterization of particles, surfaces and nanostructures.

Dr Michael Rauscher, head of business sector materials sciences at Zeiss Microscopy, said characterization is essential throughout many scientific fields such as life sciences.

“The integration of RISE microscopy in our correlative portfolio aims at delivering cutting edge technology to these and many other areas of research. We are very happy that with WITec we have a partner that shares our ambition to drive scientific advancement.”

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